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Volumn 3395, Issue , 2005, Pages 170-179

Test patterns with TTCN-3

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAMMING LANGUAGES; COMPUTER SOFTWARE REUSABILITY; PROBLEM SOLVING; PRODUCT DEVELOPMENT;

EID: 24144496063     PISSN: 03029743     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1007/978-3-540-31848-4_12     Document Type: Conference Paper
Times cited : (8)

References (13)
  • 4
    • 33645616103 scopus 로고    scopus 로고
    • ETSI draft report: Methods for Testing and Specification (MTS)
    • March
    • ETSI Draft Report: Methods for Testing and Specification (MTS) M. Frey et al,: Pattern for Test Development (PTD), March 2004.
    • (2004) Pattern for Test Development (PTD)
    • Frey, M.1
  • 13
    • 33645626353 scopus 로고    scopus 로고
    • AG Communication Systems
    • D. Delano, L. Rising, System Test Pattern Language, AG Communication Systems http://www.agcs.com/supportv2/techpapers/patterns/papers/systestp. htm#TestersMoreImportant
    • System Test Pattern Language
    • Delano, D.1    Rising, L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.