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Volumn 3395, Issue , 2005, Pages 170-179
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Test patterns with TTCN-3
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER PROGRAMMING LANGUAGES;
COMPUTER SOFTWARE REUSABILITY;
PROBLEM SOLVING;
PRODUCT DEVELOPMENT;
LANGUAGE FEATURES;
TEST PATTERNS;
TESTING AND TEST CONTROL NOTATION (TTCN);
SOFTWARE ENGINEERING;
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EID: 24144496063
PISSN: 03029743
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1007/978-3-540-31848-4_12 Document Type: Conference Paper |
Times cited : (8)
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References (13)
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