The dielectric constant in a thermal phase transition magnetic material composed of rubidium manganese hexacyanoferrate observed by spectroscopic ellipsometry

Journal of Materials Chemistry

Volumn 15, Issue 32, 2005, Pages 3291-3295

  Ohkoshi, Shin Ichi ^a,b   Nuida, Tomohiro ^a   Matsuda, Tomoyuki ^a   Tokoro, Hiroko ^a   Hashimoto, Kazuhito ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEXATION; ELLIPSOMETRY; INFRARED RADIATION; MAGNETIC MATERIALS; MANGANESE; PHASE TRANSITIONS; RESONANCE; RUBIDIUM COMPOUNDS;

NEAR-INFRARED REGIONS; RUBIDIUM MANGANESE HEXACYANOFERRATE; SPECTROSCOPIC ELLIPSOMETRY (SE); THERMAL PHASE TRANSITION;

PERMITTIVITY;

EID: 24144492124     PISSN: 09599428     EISSN: None     Source Type: Journal    
DOI: 10.1039/b504062k     Document Type: Article

References (38)

1. (a) H. A. Goodwin, Coord. Chem. Rev., 1976, 18, 293;
2. (b) P. Gütlich, Struct. Bonding, Springer-Verlag, Berlin, 1981, vol. 44, p. 83;
3. (c) P. Gütlich and A. Hauser, Coord. Chem. Rev., 1990, 97, 1;
4. (d) O. Kahn, Molecular Magnetism, VCH, New York, 1993;
5. (e) O. Kahn, J. Kröber and C. Jay, Adv. Mater., 1992, 4, 718;
6. (f) O. Kahn and C. J. Martinez, Science, 1998, 279, 44;
7. (g) M. Sorai, Bull. Chem. Soc. Jpn., 2001, 74, 2223.
8. (a) H. Kitagawa, N. Onodera, T. Sonoyama, M. Yamamoto, T. Fukuwa, T. Mitani, M. Seto and Y. Maeda, J. Am. Chem. Soc., 1999, 121, 10068;
9. (b) N. Kojima, W. Aoki, M. Seto, Y. Kobayashi and Y. Maeda, Synth. Met., 2001, 121, 1796;
10. (c) O. S. Jung, H. D. Jo, Y. A. Lee, J. B. Conklin and G. C. Pierpont, Inorg. Chem., 1997, 36, 19;
11. (d) D. M. Adams, A. Dei, A. L. Rheingold and D. N. Hendrickson, J. Am. Chem. Soc., 1993, 115, 8221.
12. (a) D. B. Brown, Mixed Valence Compounds, NATO ASI, Reidel, Dordrecht, 1980;
13. (b) K. Prassides, Mixed Valency Systems: Applications in Chemistry, Physics and Biology, NATO ASI, Kluwer, Dordrecht, 1991;
14. (c) M. B. Robin and P. Day, Adv. Inorg. Chem. Radiochem., 1967, 10, 247;
15. (d) N. S. Hush, Prog. Inorg. Chem., 1967, 8, 391;
16. (e) D. N. Hendrickson, Mixed Valency Systems: Applications in Chemistry, Physics and Biology, Kluwer, Boston, 1991;
17. (f) S. B. Piepho, E. R. Krausz and P. N. Schatz, J. Am. Chem. Soc., 1978, 10, 2996;
18. (g) S. A. Borshch and K. Prassides, J. Phys. Chem., 1996, 100, 9348.
19. (a) M. Nakano, G. Matsubayashi and T. Matsuo, Phys. Rev. B, 2002, 66, 212412;
20. (b) A. Bousseksou, G. Molnár, P. Demont and J. Menegotto, J. Mater. Chem., 2003, 13, 2069.
21. (a) R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light, North-Holland, Amsterdam, 1987;
22. (b) H. G. Tompkins and W. A. McGahan, Spectroscopic Ellipsometry and Reflectometry, John Wiley & Sons, New York, 1999;
23. (c) P. Drude, Ann. Phys., 1887, 32, 584;
24. (d) P. Drude, Ann. Phys., 1888, 34, 489;
25. (e) L. Tronstand, Trans. Faraday Soc., 1933, 29, 502;
26. (f) W. Palik and J. O'M. Bockris, Surf. Sci., 1971, 28, 61;
27. (g) J. A. Woollam, P. G. Snyder and M. C. Rost, Thin Solid Films, 1988, 166, 317;
28. (h) J. A. Woollam, B. Johs, C. M. Herzinger, J. Hilfiker, R. Synowicki and C. L. Bungay, Crit. Rev. Opt. Sci. Technol., 1999, CR72, 3.
29. (a) S. Ohkoshi, H. Tokoro, M. Utsunomiya, M. Mizuno, Y. Abe and K. Hashimoto, J. Phys. Chem. B, 2002, 106, 2423;
30. (b) H. Tokoro, S. Ohkoshi, T. Matsuda and K. Hashimoto, Inorg. Chem., 2004, 43, 5231.
31. (a) Brewster's angle is the incident angle at which the reflected light from the surface of the material completely becomes polarized light. p-Polarized light decreases to zero at Brewster's angle and increases afterwards. In contrast, s-polarized light monotonously increases with increasing incident angle;
32. (b) since Erp is close to zero around Brewster's angle, Ψ becomes zero as shown in eqn. (1);
33. -1 N. Since the N value increases at the optical resonance wavelength of the material, Brewster's angle varies depending on the wavelength, with the result that the V value at an incident light waves against wavelength.
34. Although the pressure effect in this phase transition is observed, the phase transition temperatures return to the original state when the pressure is released. Hence, this sample shows a normal phase transition as shown in Fig. 1.
35. P. N. Schatz, A. J. McCaffery, W. Suëtaka, G. N. Henning, A. B. Ritchie and P. J. Stephens, J. Chem. Phys., 1966, 45, 722.
36. K. Kato, Y. Moritomo, M. Takata, M. Sakata, M. Umekawa, N. Hamada, S. Ohkoshi, H. Tokoro and K. Hashimoto, Phys. Rev. Lett., 2003, 91, 255502.
37. T. S. Davis, J. P. Fackler and M. J. Weeks, Inorg. Chem., 1968, 7, 1994.
38. S. Kück, S. Hartung, S. Hurling, K. Petermann and G. Huber, Phys. Rev. B, 1998, 57, 2203.