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Volumn 116, Issue 11, 2005, Pages 507-510

A digital spatial carrier for wavelet phase extraction

Author keywords

Fringe pattern; Phase shifting; Unwrapping process; Wavelet phase extraction

Indexed keywords

MOS DEVICES; PHASE SEPARATION; PHASE SHIFT; TRANSISTORS;

EID: 24144481856     PISSN: 00304026     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijleo.2005.03.006     Document Type: Article
Times cited : (11)

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  • 6
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    • K. Nassim, L. Joannes, A. Cornet, S. Dilhaire, E. Schaub, W. Claeys, High resolution interferometry (HRI) and electronic speckle pattern interferometry (ESPI) applied to the thermomechanical study of MOS power transistor, IEEE Trans. Components Packag. Manuf. Technol. (1998).
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    • The stationary wavelet transform and some statistical applications
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.