Characterization of ferroelectric property of c-axis and non-c-axis oriented epitaxially grown bismuth layer-structured ferroelectric thin films with different m-numbers prepared by MOCVD

Materials Research Society Symposium - Proceedings

Volumn 655, Issue , 2001, Pages

  Watanabe, Takayuki ^a   Sakai, Tomohiro ^a   Saiki, Atsushi ^a   Saito, Keisuke ^b   Chikyo, Toyohiko ^c   Funakubo, Hiroshi ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b PHILIPS RESEARCH LABORATORIES   (Germany)

^c NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

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Indexed keywords

EID: 24144472574     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

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