Ordering mutants to minimise test effort in mutation testing

Lecture Notes in Computer Science

Volumn 3395, Issue , 2005, Pages 195-209

  Kapoor, Kalpesh ^a   Bowen, Jonathan P ^b  

^a DHIRUBHAI AMBANI INSTITUTE OF INFORMATION AND COMMUNICATION TECHNOLOGY   (India)

^b LONDON SOUTH BANK UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; COMPUTER SYSTEMS PROGRAMMING; HIERARCHICAL SYSTEMS; MATHEMATICAL OPERATORS; PROBLEM SOLVING;

FAULT-BASED TESTING; MUTATION OPERATORS; MUTATION TESTING;

FAULT TOLERANT COMPUTER SYSTEMS;

EID: 24144457529     PISSN: 03029743     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1007/978-3-540-31848-4_14     Document Type: Conference Paper

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