Introduction of photoemission electron microscopes at SPring-8 for nanotechnology support

Journal of Physics Condensed Matter

Volumn 17, Issue 16, 2005, Pages

  Guo, Fangzhun ^a   Wakita, Takanori ^a   Shimizu, Hiroshi ^b   Matsushita, Tomohiro ^a   Yasue, Tuneo ^b   Koshikawa, Takanori ^b   Bauer, Ernst ^c   Kobayashi, Keisuke ^a  

^a JASRI ^*  (Japan)

^b OSAKA ELECTRO COMMUNICATION UNIVERSITY   (Japan)

^c ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON MICROSCOPY; ELECTROSTATICS; LENSES; NANOTECHNOLOGY; SPECTROSCOPIC ANALYSIS; X RAYS;

ELECTROSTATIC LENS; ENERGY FILTERS; MAGNETIC LENS; PHOTOEMISSION ELECTRON MICROSCOPY (PEEM) SYSTEMS;

PHOTOEMISSION;

EID: 24144447631     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/17/16/007     Document Type: Article

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