Local structural characterization of Zn:Cd:Se ternary semiconductors

Thin Solid Films

Volumn 490, Issue 2, 2005, Pages 165-167

  Camargo Gamboa, G J ^a   Lezama Pacheco, J S ^a   Mustre De Leon J ^a   Conradson, S D ^b   Hernandez Calderon I ^c  

^a DEPARTAMENTO DE FÍSICA APLICADA   (Mexico)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

^c DEPARTAMENTO DE FÍSICA   (Mexico)

Author keywords

Local atomic structure; Ternary semiconductors; XAFS; Zn:Cd:Se

Indexed keywords

CADMIUM COMPOUNDS; CHARACTERIZATION; CRYSTAL ATOMIC STRUCTURE; MOLECULAR BEAM EPITAXY; X RAY SPECTROSCOPY; ZINC;

ATOMIC LAYER EPITAXY (ALE); LOCAL ATOMIC STRUCTURE; TERNARY SEMICONDUCTORS; X-RAY ABSORPTION; X-RAY ABSORPTION SPECTROSCOPY (XAS); XAFS; ZN:CD:SE;

SEMICONDUCTOR MATERIALS;

EID: 24044553286     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.04.049     Document Type: Conference Paper

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