Refractive-index profiling of single-mode graded-index optical planar waveguides by the inverse Wentzel-Kramers-Brillouin method with improved accuracy

Optical Engineering

Volumn 44, Issue 5, 2005, Pages 1-4

  Chiang, Kin Seng ^a   Wong, Chi Lai ^a  

^a CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Graded index waveguides; Optical measurement; Optical wave guide characterization; Refractive index profiling; Thin film characterization; Wentzel Kramers Brillouin method

Indexed keywords

DIELECTRIC MATERIALS; INTEGRATED OPTICS; OPTICAL VARIABLES MEASUREMENT; REFRACTIVE INDEX; THIN FILMS;

GRADED INDEX WAVEGUIDES; OPTICAL WAVEGUIDE CHARACTERIZATION; REFRACTIVE INDEX PROFILING; THIN FILM CHARACTERIZATION; WENTZEL-KRAMERS-BRILLOUIN METHOD;

OPTICAL WAVEGUIDES;

EID: 24044542661     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.1907624     Document Type: Article

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