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Volumn 382, Issue 8, 2005, Pages 1987-1992
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Infrared reststrahlen revisited: Commonly disregarded optical details related to n<1
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Author keywords
Infrared ellipsometry; Optical constants; Refractive index; Residual rays; Reststrahlen
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Indexed keywords
CRYSTALS;
ELLIPSOMETRY;
INFRARED SPECTROSCOPY;
LIGHT ABSORPTION;
LIGHT REFLECTION;
MATHEMATICAL MODELS;
POLYMERS;
REFRACTIVE INDEX;
ABSORPTION INDEX;
CHRISTEANSEN EFFECT;
SPECTRAL ELLIPSOMETRY;
VANISHING REFLECTION;
INFRARED RADIATION;
POLYMER;
ARTICLE;
CHEMISTRY;
CRYSTALLIZATION;
INFRARED RADIATION;
INFRARED SPECTROPHOTOMETRY;
INSTRUMENTATION;
MATHEMATICAL COMPUTING;
OPTICS;
OSCILLOMETRY;
SOLUTION AND SOLUBILITY;
STANDARD;
CRYSTALLIZATION;
INFRARED RAYS;
MATHEMATICAL COMPUTING;
OPTICS;
OSCILLOMETRY;
POLYMERS;
SOLUTIONS;
SPECTROPHOTOMETRY, INFRARED;
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EID: 24044520735
PISSN: 16182642
EISSN: None
Source Type: Journal
DOI: 10.1007/s00216-005-3407-x Document Type: Article |
Times cited : (45)
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References (15)
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