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Volumn 176, Issue 25-28, 2005, Pages 2079-2083
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Impedance study of the microstructure dependence of the electrical properties of BIMEVOXes
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Author keywords
BIMEVOX; Electrical properties; Microstructure; Oxide ion conductor; Sintering
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Indexed keywords
CRYSTAL MICROSTRUCTURE;
DOPING (ADDITIVES);
ELECTRIC CONDUCTIVITY;
ELECTRIC PROPERTIES;
MELTING;
SINTERING;
BIMEVOX;
DOPANTS;
OXIDE ION CONDUCTORS;
RELATIVE DENSITY;
SPECTROSCOPIC ANALYSIS;
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EID: 24044494271
PISSN: 01672738
EISSN: None
Source Type: Journal
DOI: 10.1016/j.ssi.2004.06.026 Document Type: Conference Paper |
Times cited : (57)
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References (11)
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