Structural refinement of Eu doped CaMgSi2O6 using X-ray powder diffraction data

Journal of Luminescence

Volumn 115, Issue 1-2, 2005, Pages 1-6

  Kim, Yong Il ^a,c   Nahm, Seung Hoon ^a   Im, Won Bin ^b   Jeon, Duk Young ^b   Gregory, Duncan H ^c  

^a Korea Research Institute of Standards and Science   (South Korea)

^b Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^c UNIVERSITY OF NOTTINGHAM   (United Kingdom)

Author keywords

Blue emission; Photoluminescence; Plasma display panel; X ray crystallography

Indexed keywords

DOPING (ADDITIVES); EUROPIUM; MAGNESIA; PARAMETER ESTIMATION; SILICA; SYNTHESIS (CHEMICAL); X RAY POWDER DIFFRACTION;

PHASE FRACTIONS; RIETVELD REFINEMENT; STRUCTURAL PARAMETERS; STRUCTURAL REFINEMENT;

CALCIUM COMPOUNDS;

EID: 24044489610     PISSN: 00222313     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jlumin.2005.02.006     Document Type: Article

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