메뉴 건너뛰기




Volumn 37, Issue 8, 1998, Pages 70-80

Tests evaluate the influence of junctions on PIM

Author keywords

[No Author keywords available]

Indexed keywords


EID: 24044468756     PISSN: 07452993     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article
Times cited : (4)

References (8)
  • 1
    • 24044525515 scopus 로고
    • Metal-insulator-metal junctions as surface sources of intermodulation
    • February
    • T.G. Shands and J.A. Woody, "Metal-Insulator-Metal Junctions as Surface Sources of Intermodulation," final technical report, February 1983.
    • (1983) Final Technical Report
    • Shands, T.G.1    Woody, J.A.2
  • 5
    • 34548442416 scopus 로고
    • Passive intermodulation interference in communication systems
    • June
    • "Passive Intermodulation Interference in Communication Systems," Electronics & Communication Engineering Journal, June 1990.
    • (1990) Electronics & Communication Engineering Journal
  • 6
    • 24044462009 scopus 로고
    • Intermodulationsmessungen an passiven Mikrowellenkomponenten and Antennenleitungen
    • September
    • J. Siegenthaler, "Intermodulationsmessungen an passiven Mikrowellenkomponenten and Antennenleitungen," Technische Mitteilungen PTT, September 1939.
    • (1939) Technische Mitteilungen PTT
    • Siegenthaler, J.1
  • 8
    • 24044465414 scopus 로고    scopus 로고
    • Suhner® Sucoplate® surface plating for RF components
    • July
    • "Suhner® Sucoplate® Surface Plating for RF Components," Huber + Suhner AG data sheet, July 1996.
    • (1996) Huber + Suhner AG Data Sheet


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.