Effects of strain field in nitrogen-mediated Co film growth on Cu(001): Segregation and electronic structure change

Surface Science

Volumn 590, Issue 2-3, 2005, Pages 138-145

  Sekiba, Daiichiro ^a   Doi, Shunsuke ^a   Nakatsuji, Kan ^a   Komori, Fumio ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

Cobalt; Copper; Epitaxy; Growth; Ion implantation methods; Low energy electron diffraction (LEED); Models of surface kinetics; Nanopatterning; Scanning tunneling microscopy; Surface segregation; Surface stress; Surface tension; X ray photoelectron spectroscopy

Indexed keywords

ELECTRONIC STRUCTURE; NITROGEN; SATURATION (MATERIALS COMPOSITION); SEGREGATION (METALLOGRAPHY); STRAIN; SURFACE ACTIVE AGENTS; SURFACES;

ATOM SEGREGATION; CORE-LEVEL SHIFT; GROWTH MODES; STRAIN FIELD;

FILM GROWTH;

EID: 23944510161     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2005.05.067     Document Type: Article

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