Guest editorial: Special issue on biometric systems

IEEE Transactions on Systems, Man and Cybernetics Part C: Applications and Reviews

Volumn 35, Issue 3, 2005, Pages 273-275

  Zhang, David ^a   Campbell, Joseph P ^b   Maltoni, Davide ^c   Bolle, Ruud M ^d  

^a HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

^b MIT LINCOLN LABORATORY   (United States)

^c UNIVERSITY OF BOLOGNA   (Italy)

^d IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 23944502034     PISSN: 10946977     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSMCC.2005.848152     Document Type: Editorial

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