|
Volumn 41, Issue 16, 2005, Pages 891-893
|
Random numbers from metastability and thermal noise
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ALGORITHMS;
CMOS INTEGRATED CIRCUITS;
COMPUTER SIMULATION;
CRYPTOGRAPHY;
THERMAL NOISE;
LOW-COST DESIGN;
METASTABILITY;
MODELING APPLICATIONS;
RANDOM NUMBERS;
RANDOM NUMBER GENERATION;
|
EID: 23944498168
PISSN: 00135194
EISSN: None
Source Type: Journal
DOI: 10.1049/el:20051559 Document Type: Article |
Times cited : (21)
|
References (8)
|