Elucidating a particulate matter deposition episode by combining scanning electron microscopy and X-ray fluorescence spectrometry

Analytical Sciences

Volumn 21, Issue 7, 2005, Pages 763-767

  Vázquez, Cristina ^a   Custo, Graciela ^a   Dawidowski, Laura ^a   Gómez, Darío ^a   Villegas, Marina ^a   Ortiz, Martha ^a   Miyagusuku, Mayumi ^a  

^a DEPARTAMENTO DE FÍSICA   (Argentina)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE; FLUORESCENCE SPECTROSCOPY; MORPHOLOGY; POLLUTION; SCANNING ELECTRON MICROSCOPY; SCREENING; SMOKE; SPECTROMETRY; X RAYS;

AVERAGE CONCENTRATION; COMPOSITION PROFILE; ENVIRONMENTAL SAMPLE; PARTICLE MORPHOLOGIES; PARTICULATE MATTER; SCREENING ANALYSIS; WAVELENGTH-DISPERSIVE X-RAY FLUORESCENCES; X RAY FLUORESCENCE SPECTROMETRY;

PARTICLES (PARTICULATE MATTER);

EID: 23944469407     PISSN: 09106340     EISSN: 13482246     Source Type: Journal    
DOI: 10.2116/analsci.21.763     Document Type: Article

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