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Volumn 27, Issue 7, 2005, Pages 1217-1228

Three-dimensional grain fabric measurements using high-resolution X-ray computed tomography

Author keywords

Computed tomography; Contact normals; Fabric analysis; Intercept methods; Preferred orientations

Indexed keywords

CONTACT NORMALS; FABRIC ANALYSIS; INTERCEPT METHODS; PREFERRED ORIENTATIONS; X RAY COMPUTED TOMOGRAPHY;

EID: 23944450838     PISSN: 01918141     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jsg.2005.02.006     Document Type: Article
Times cited : (198)

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