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Volumn 4, Issue , 2005, Pages 2341-2346

Process control applications of subspace and regression-based identification and monitoring methods

Author keywords

Fault detection; Industrial processes; Monitoring; Multivariate regression; Subspace system identification

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; MATHEMATICAL MODELS; MONITORING; PROCESS CONTROL; REGRESSION ANALYSIS;

EID: 23944432485     PISSN: 07431619     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (12)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.