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Volumn 35, Issue 1, 1999, Pages 54-59

Sensor properties of polycrystalline SnO 2 films doped with Ni

Author keywords

[No Author keywords available]

Indexed keywords


EID: 23844550963     PISSN: 00201685     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (3)

References (11)
  • 1
    • 0029309726 scopus 로고
    • 2 Sensors: Current Status and Future Prospects
    • 2 Sensors: Current Status and Future Prospects, Sens. Actuators, B, 1995, vol. 25/26, pp. 1-12.
    • (1995) Sens. Actuators, B , vol.25-26 , pp. 1-12
    • Gopel, W.1    Schierbaum, K.D.2
  • 5
    • 0000703844 scopus 로고    scopus 로고
    • Pyrosol Spraying Deposition of Copper- And Nickel-Doped Tin Oxide Films
    • Rumyantseva, M.N., Gaskov, A.M., Ryabova, L.I., et al., Pyrosol Spraying Deposition of Copper- and Nickel-Doped Tin Oxide Films, J. Mater. Sci. Eng. B, 1996, vol. 41, pp. 333-338.
    • (1996) J. Mater. Sci. Eng. B , vol.41 , pp. 333-338
    • Rumyantseva, M.N.1    Gaskov, A.M.2    Ryabova, L.I.3
  • 6
    • 0029308793 scopus 로고
    • Copper-Doping Level Effect on Sensitivity and Selectivity of Tin Oxide Thin-Film Gas Sensor
    • Galdikas, A., Mironas, A., and Setkus, A., Copper-Doping Level Effect on Sensitivity and Selectivity of Tin Oxide Thin-Film Gas Sensor, Sens. Actuators, B, 1995, vol. 26/27, pp. 29-32.
    • (1995) Sens. Actuators, B , vol.26-27 , pp. 29-32
    • Galdikas, A.1    Mironas, A.2    Setkus, A.3
  • 8
    • 0002590666 scopus 로고
    • 2 Sensor for Volatile Sulfides
    • Seyama, T., Ed., Amsterdam: Eisevier
    • 2 Sensor for Volatile Sulfides, Chemical Sensor Technology, Seyama, T., Ed., Amsterdam: Eisevier, 1988, vol. 1, p. 39.
    • (1988) Chemical Sensor Technology , vol.1 , pp. 39
    • Takahata, K.1
  • 9
    • 0000597583 scopus 로고
    • Un nouveau modèle de calcule pour la microanalyse quantitative par spectrométrie de rayons X. Partie II: Application à l'analyse d' échantillons hétérogènes en profondeur
    • Pouchou, J.L. and Pichoir, F., Un nouveau modèle de calcule pour la microanalyse quantitative par spectrométrie de rayons X. Partie II: Application à l'analyse d' échantillons hétérogènes en profondeur, Rech. Aerosp., 1984, no. 5, pp. 349-367.
    • (1984) Rech. Aerosp. , Issue.5 , pp. 349-367
    • Pouchou, J.L.1    Pichoir, F.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.