Multiple-instrument analyses of single micron-size particles

Microscopy and Microanalysis

Volumn 11, Issue 4, 2005, Pages 354-362

  Admon, Uri ^a   Donohue, David ^a   Aigner, Helmut ^a   Tamborini, Gabriele ^b   Bildstein, Olivier ^b   Betti, Maria ^b  

^a INTERNATIONAL ATOMIC ENERGY AGENCY   (Austria)

^b JOINT RESEARCH CENTRE   (Italy)

Author keywords

Environmental particle analysis; Forensics; Gunshot residues (GSR); Nuclear forensics; Particle analysis; Re location; SEM; SIMS; Triangulation

Indexed keywords

EID: 23844531707     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927605050312     Document Type: Article

References (18)

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