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Volumn 5745, Issue I, 2005, Pages 387-398

Flat panel CT detectors for sub-second volumetric scanning

Author keywords

Amorphous silicon; Cone Beam CT; CT; Flat Panel Detector; FPD; High frame rate

Indexed keywords

AMORPHOUS SILICON; COMPUTERIZED TOMOGRAPHY; ENGINEERING RESEARCH; PHOSPHORS; PHOTONS; SCANNING; VISUALIZATION;

EID: 23844527948     PISSN: 16057422     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.595631     Document Type: Conference Paper
Times cited : (6)

References (8)
  • 1
    • 3042549009 scopus 로고    scopus 로고
    • Multiple gain ranging readout method to extend the dynamic range of amorphous silicon flat panel imagers
    • Feb. San Diego, CA
    • P.G. Roos et al., "Multiple gain ranging readout method to extend the dynamic range of amorphous silicon flat panel imagers," Proceedings of SPIE Medical Imaging, 5368-16, Feb. 2004, San Diego, CA.
    • (2004) Proceedings of SPIE Medical Imaging , vol.5368 , Issue.16
    • Roos, P.G.1
  • 3
    • 3042549096 scopus 로고    scopus 로고
    • Design and performance of a 32-slice CT detector system using back-illuminated photodiodes
    • Feb. San Diego, CA
    • S. Utrup et al. "Design and performance of a 32-slice CT detector system using back-illuminated photodiodes," Proceedings of SPIE Medical Imaging, 5368-06, Feb. 2004, San Diego, CA.
    • (2004) Proceedings of SPIE Medical Imaging , vol.5368 , Issue.6
    • Utrup, S.1
  • 4
    • 0037360947 scopus 로고    scopus 로고
    • Megavoltage cone-beam CT using a high efficiency image receptor
    • E.J. Seppi et al., "Megavoltage cone-beam CT using a high efficiency image receptor," Int. J. Radiation Oncology Biol. Phys., Vol.55, No.3, pp. 793-803, 2003.
    • (2003) Int. J. Radiation Oncology Biol. Phys. , vol.55 , Issue.3 , pp. 793-803
    • Seppi, E.J.1
  • 7
    • 33645191299 scopus 로고    scopus 로고
    • Dobbins in HMI p197 et seq.
    • Dobbins in HMI p197 et seq.
  • 8
    • 0033740285 scopus 로고    scopus 로고
    • DQE(f) of an amorphous-silicon flat-panel x-ray detector: Detector parameter influences and measurement methodology
    • 13-15 Feb
    • P.R. Granfors, R. Aufrichtig, "DQE(f) of an amorphous-silicon flat-panel x-ray detector: detector parameter influences and measurement methodology," Proc. SPIE Med.Img.2000, vol.3977, pg.2-13, 13-15 Feb 2000.
    • (2000) Proc. SPIE Med.Img.2000 , vol.3977 , pp. 2-13
    • Granfors, P.R.1    Aufrichtig, R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.