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Volumn 44, Issue 22, 2005, Pages 4639-4647
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Self-referenced prism deflection measurement schemes with microradian precision
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC ATTENUATORS;
INTERFEROMETRY;
LASERS;
LIGHT INTERFERENCE;
OPTICAL BEAM SPLITTERS;
PRISMS;
VECTORS;
WAVEFRONTS;
DEFLECTION ANGLES;
LASER INTERFEROMETRY;
MICRORADIAN PRECISION;
SELF-REFERENCED PRISM DEFLECTION;
DEFLECTION (STRUCTURES);
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EID: 23844505449
PISSN: 1559128X
EISSN: 15394522
Source Type: Journal
DOI: 10.1364/AO.44.004639 Document Type: Article |
Times cited : (2)
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References (6)
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