An explanation for the extremely low, but variable radiation dosages measured in a linear slit scanning radiography system

Progress in Biomedical Optics and Imaging - Proceedings of SPIE

Volumn 5745, Issue II, 2005, Pages 1138-1145

  Potgieter, J Herman ^a   De Villiers, Mattieu ^a   Scheelke, Martin ^a   De Jager, Gerhard ^b  

^a Lodox Systems Pty Ltd   (South Africa)

^b UNIVERSITY OF CAPE TOWN   (South Africa)

Author keywords

Digital; Linear slit scanning; Radiation exposure; Scatter to primary ratio; Skin entrance dose; Skin sparing; Slit scanning; X ray

Indexed keywords

DOSIMETRY; ELECTROMAGNETIC WAVE BACKSCATTERING; RADIOLOGY; SCANNING; SKIN; X RAYS;

DIGITAL; LINEAR SLIT SCANNING; RADIATION EXPOSURE; SCATTER TO PRIMARY RATIO; SKIN ENTRANCE DOSE; SKIN SPARING; SLIT SCANNING;

RADIOGRAPHY;

EID: 23844504620     PISSN: 16057422     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.595216     Document Type: Conference Paper

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