An investigation of non-linear stress-strain behavior of thin metal films

Materials Research Society Symposium Proceedings

Volumn 841, Issue , 2005, Pages 345-350

  Huber, N ^a   Dietz, T ^a   Tyulyukovskiy, E ^a  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; CHARACTERIZATION; COMPUTER SIMULATION; ELASTIC MODULI; FINITE ELEMENT METHOD; HARDNESS; INDENTATION; MICROELECTRONICS; NEURAL NETWORKS; STIFFNESS; STRAIN; STRENGTH OF MATERIALS; STRESS ANALYSIS; THIN FILMS;

ION BEAM MICROSCOPY; MECHANICAL CHARACTERIZATION; NANO-MECHANICAL SYSTEMS; NON-LINEAR STRESS-STRAIN BEHAVIOR; THIN METAL FILMS;

METALLIC FILMS;

EID: 23844503924     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)

1. R. Schwaiger and O. Kraft, J. Mater. Res. 19, 315 (2004).
2. K. Tunvisut, N. P. O'Dowd and E. P. Busso, Int. J. Solids Structures 38, 335 (2001).
3. N. Huber, W. D. Nix and H. Gao, Proc. R. Soc. Lond. A 458, 1593 (2002).