Monolithic voltage conversion in low-voltage CMOS technologies

Microelectronics Journal

Volumn 36, Issue 9, 2005, Pages 863-867

  Kursun, Volkan ^a   De, Vivek K ^b   Friedman, Eby G ^c   Narendra, Siva G ^b  

^a University of Wisconsin Madison   (United States)

^b INTEL CORPORATION   (United States)

^c University of Rochester   (United States)

Author keywords

High DC DC voltage conversion ratio; High voltage stress; Low voltage DC DC converters; Monolithic DC DC conversion; Transistor reliability

Indexed keywords

ELECTRIC CONVERTERS; ELECTRIC LOSSES; MICROPROCESSOR CHIPS; SWITCHING CIRCUITS; TRANSISTORS; VOLTAGE CONTROL;

HIGH DC-DC VOLTAGE CONVERSION RATIO; HIGH-VOLTAGE STRESS; LOW-VOLTAGE DC-DC COVERTERS; MONOLITHIC DC-DC CONVERSION; TRANSISTOR RELIABILITY;

CMOS INTEGRATED CIRCUITS;

EID: 23844498784     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mejo.2005.03.008     Document Type: Conference Paper

References (3)

1. V. Kursun, S.G. Narendra, V.K. De, and E.G. Friedman Monolithic DC-DC converter analysis and MOSFET gate voltage optimization Proceedings of the IEEE/ACM International Symposium on Quality Electronic Design, March 2003 pp. 279-284
2. V. Kursun, S.G. Narendra, V.K. De, and E.G. Friedman Analysis of buck converters for on-chip integration with a dual supply voltage microprocessor IEEE Transactions on Very Large Scale Integration (VLSI) Systems 11 3 2003 514 522
3. Y. Panov, and M.M. Jovanovic Design and performance evaluation of low-voltage/high-current DC/DC on-board modules IEEE Transactions on Power Electronics 16 1 2001 26 33