Eclipse laser photodetachment method for avoiding probe surface ablation in negative ion measurement

Plasma Sources Science and Technology

Volumn 14, Issue 3, 2005, Pages 566-575

  Kajita, Shin ^a,b   Kado, Shinichiro ^a   Tanaka, Satoru ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b NAGOYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; ELECTROSTATICS; GROUND STATE; LASER BEAM EFFECTS; PLASMAS; TOKAMAK DEVICES; TUNGSTEN;

ION DENSITY; LASER PHOTODETACHMENT (LPD); LASER POWER; NEGATIVE ION MEASUREMENT;

LASER ABLATION;

EID: 23844498482     PISSN: 09630252     EISSN: None     Source Type: Journal    
DOI: 10.1088/0963-0252/14/3/020     Document Type: Article

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