Nano-scale roughness inducing super-water-repellency: From natural to artificial

Materials Research Society Symposium Proceedings

Volumn EXS, Issue 1, 2004, Pages 365-368

  Wu, Yunying ^a,b   Liu, Changsong ^a   Kouno, Masao ^a   Kuroda, Masahiro ^a   Sugimura, Hiroyuki ^a   Inoue, Yasushi ^a   Takai, Osamu ^a  

^a NAGOYA UNIVERSITY   (Japan)

^b AICHI SCIENCE AND TECHNOLOGY FOUNDATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; NANOSTRUCTURED MATERIALS; PLANTS (BOTANY); PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SCANNING ELECTRON MICROSCOPY; SURFACE ROUGHNESS;

FIELD ION BEAM (FIB); NANO-SCALE ROUGHNESS; NANOSTRUCTURES; PLANT LEAVES;

HYDROPHOBICITY;

EID: 23844492768     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

1. D. L. Schmidt, C. E. Coburn, B. M. Dekoven, G. E. Potter, G. F. Meyers, D. A. Fischer, Nature 368, 39 (1994).
2. P. Ball, Nature 400, 507 (1999).
3. A. Nakajima, A. Fujishima, K. Hashimoto, T. Watanabe, Adv. Mater. 11, 1365 (1999).
4. Y. Wu, H. Sugimura, Y. Inoue, O. Takai, Chem. Vap. Deposition 8, 47 (2002).
5. R. Daw, Nature, 416, 376 (2002).
6. F. Lin, S. H. Li, Y. S. Li, H. J. Li, H. J. Zhang, J. Zhai, Y. L. Song, B. Q. Liu, L. Jiang, D. B. Zhu, Adv. Mater. 14, 1857 (2002).
7. T. Onda, S. Shibuichi, N. Satoh, K. Tsujii, Langmuir 12, 2125 (1996).
8. D. Oner, T. J. McCarthy, Langmuir 16, 7777 (2000).
9. C. W. Extrand, Langmuir 18, 7991 (2002).
10. Z. Yoshimitsu, A. Nakajima, T. Watanabe, K. Hashimoto, Langmuir 18, 5818 (2002).