Sub-micron sized intrinsic Josephson junctions in YBa2Cu 3O7-X whiskers

Superconductor Science and Technology

Volumn 18, Issue 9, 2005, Pages 1159-1162

  Kawae, Takeshi ^a   Nagao, Masanori ^a   Takano, Yoshihiko ^a   Wang, Huabing ^a   Hatano, Takeshi ^a   Kim, Sang Jae ^b   Yamashita, Tsutomu ^c  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b Jeju National University   (South Korea)

^c HIROSAKI UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POTENTIAL; ETCHING; FABRICATION; ION BEAMS; SEMICONDUCTOR JUNCTIONS; THERMAL EFFECTS; YTTRIUM COMPOUNDS;

CURRENT-VOLTAGE CURVE; INTRINSIC JOSEPHSON FUNCTION (IJF); JUNCTION PROPERTIES; PLASMA FREQUENCIES;

CRYSTAL WHISKERS;

EID: 23844484204     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/18/9/002     Document Type: Article

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