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Volumn 44, Issue 7, 2005, Pages 1378-1382
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Application of proton induced X-ray emission (PIXE) in estimation of trace metals entrapped in silica matrix
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 23844471940
PISSN: 03764710
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (3)
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References (20)
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