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Volumn 44, Issue 7, 2005, Pages 1378-1382

Application of proton induced X-ray emission (PIXE) in estimation of trace metals entrapped in silica matrix

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EID: 23844471940     PISSN: 03764710     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (3)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.