Sol-gel synthesis of long persistent phosphor Sr2MgSi 2O7: Eu, Dy thin film

Journal of the Ceramic Society of Japan

Volumn 113, Issue 1319, 2005, Pages 484-487

  Shirakura, Shigeki ^a   Toda, Kenji ^a   Imanari, Yu Ichiro ^a   Nonogawa, Takashi ^a   Uematsu, Kazuyoshi ^a   Sato, Mineo ^a   Nishisu, Yoshihiro ^b   Kobayashi, Mikio ^b  

^a NIIGATA UNIVERSITY   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Europium; Long persistent phosphor; Silicate; Sol gel; Thin film; Trap

Indexed keywords

EUROPIUM; PHOSPHORS; REACTION KINETICS; SILICATES; SOL-GELS; STRONTIUM COMPOUNDS; SYNTHESIS (CHEMICAL);

AFTERGLOW PROPERTY; LONG PERSISTENT PHOSPHOR; SOL-GEL SYNTHESIS; TRAP;

THIN FILMS;

EID: 23844471611     PISSN: 09145400     EISSN: None     Source Type: Journal    
DOI: 10.2109/jcersj.113.484     Document Type: Article

References (11)

1. "Phosphor Handbook," Ed. by Phosphor Research Society (1993) pp. 346-350 [in Japanese].
2. Matsuzawa, T., Takeuchi, N., Aoki, Y. and Murayama, Y., The 248th Meeting Technical Digest (1993) pp. 7-13 [in Japanese].
3. Murayama, Y., Nikkei Science, Vol. 26, pp. 20-29 (1996) [in Japanese].
4. Matsuzawa, T., Aoki, Y., Takeuchi, N. and Murayama, Y., J. Electrochem. Soc., Vol. 143, pp. 2670-2673 (1996).
5. Fujita, A., Maruyama, T., Shimoda, T. and Takeishi, H., "Hoso: Pavement," Kensetsu Tosyo (1997) pp. 32-36 [in Japanese].
6. Lin, Y., Tang, Z., Zhang, Z., Wang, X. and Zhang, J., J. Mater. Sci. Lett., Vol. 20, pp. 1505-1506 (2001).
7. Toda, K., Imanari, Y., Nonogawa, T., Miyoshi, J., Uematsu, K. and Sato, M., J. Ceram. Soc. Japan, Vol. 110, pp. 283-288 (2002) [in Japanese].
8. Jiang, L., Chang, C., Mao, D. and Zhang, B., Mater. Lett., Vol. 58, PP. 1825-1829 (2004).
9. Peng, T., Huajun, L., Yang, H. and Yan, C., Mater. Chem. Phys., Vol. 85, pp. 68-72 (2004).
10. Tang, Z., Zhang., F., Zhang, Z., Huang, C. and Lin, Y., J. Eur. Ceram. Soc., Vol. 20, pp. 2129-2132 (2000).
11. Lu, Y., Li, Y., Xiong, Y., Wang, D. and Yin, Q., Microelectro. J., Vol. 35, pp. 379-382 (2004).