Analysis of the SEU behavior of PowerPC 603R under heavy ions

European Space Agency, (Special Publication) ESA SP

Volumn , Issue 536, 2004, Pages 289-293

  Bezerra, Françoise ^a   Kuitunen, Juha ^b  

^a CNES   (France)

^b PATRIA ^*  (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS PACKAGING; ERROR ANALYSIS; FORMAL LOGIC; GRINDING (MACHINING); HEAVY IONS; IRRADIATION; MICROPROCESSOR CHIPS; PERSONAL COMPUTERS;

BACKSIDE IRRADIATION; ERROR DISTRIBUTION; ERROR RATE; HIGH RANGE IONS;

HIGH ENERGY PHYSICS;

EID: 23844464154     PISSN: 03796566     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. G. M. Swift, et al., "Single-Event Upset in the Power PC750 Microprocessor", IEEE Trans. Nucl. Sci., 48(6)n1822 (2001).
2. A.H. Johnston et al., F. Irom, G. Swift, "Single-Event Upset in Power-PC Processors", Workshop Radecs 2002.
3. S. Duzellier et al., "Observation of the SEE response of a 256-Mb SDRAM", Workshop Radecs 2002.
4. F. Bezerra, et al., "Commercial Processor Single Event Tests", 1997 RADECS Conference Data Workshop Record, p.41.