Penalized-likelihood sinogram restoration for CT artifact correction

IEEE Nuclear Science Symposium Conference Record

Volumn 5, Issue , 2004, Pages 3303-3307

  La Rivière, Patrick J ^a  

^a UNIVERSITY OF CHICAGO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APODIZATION; BEAM HARDENING; OFF-FOCAL RADIATION; X-RAY COLLIMATION;

ALGORITHMS; COMPUTER SIMULATION; CROSSTALK; DATA ACQUISITION; IMAGING TECHNIQUES; ITERATIVE METHODS; POISSON DISTRIBUTION; STATISTICAL METHODS; VECTORS;

COMPUTERIZED TOMOGRAPHY;

EID: 23844453178     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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