The use of softer X-rays in the structure elucidation of microporous materials

Journal of Synchrotron Radiation

Volumn 12, Issue 4, 2005, Pages 420-430

  Helliwell, M ^a   Jones, R H ^b   Kaucic, V ^c   Logar, N Z ^c  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b KEELE UNIVERSITY   (United Kingdom)

^c NATIONAL INSTITUTE OF CHEMISTRY   (Slovenia)

Author keywords

Anomalous dispersion; MAD; Microporous materials; Powder diffraction; Softer X rays; X ray absorption spectroscopy

Indexed keywords

ANOMALOUS DISPERSION; MAD; POWDER DIFFRACTION; SOFTER X-RAYS; X-RAY ABSORPTION SPECTROSCOPY;

ABSORPTION SPECTROSCOPY; CATALYSTS; MICROPOROUS MATERIALS; MOLECULAR SIEVES; SINGLE CRYSTALS; SYNCHROTRON RADIATION; X RAY CRYSTALLOGRAPHY; X RAY POWDER DIFFRACTION; X RAY SPECTROSCOPY; ZEOLITES;

X RAYS;

CERAMICS; CHEMICAL MODEL; CHEMISTRY; CONFORMATION; CRYSTALLOGRAPHY; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; POROSITY; REVIEW; SPECTROMETRY; X RAY; X RAY CRYSTALLOGRAPHY;

CERAMICS; CRYSTALLOGRAPHY; CRYSTALLOGRAPHY, X-RAY; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MODELS, CHEMICAL; MOLECULAR CONFORMATION; POROSITY; SPECTROMETRY, X-RAY EMISSION; X-RAYS;

EID: 23844445870     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049504032327     Document Type: Conference Paper

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