Lattice-constant and stress measurement in single crystals: A new method

Journal of Applied Crystallography

Volumn 38, Issue 4, 2005, Pages 678-684

  Ortner, Balder ^a  

^a UNIVERSITY OF LEOBEN   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 23744508038     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889805019370     Document Type: Article

References (5)

1. Bond, W. L. (1960). Acta Cryst. 13, 814-818.
2. JCPDS-ICDD (1993). Powder Diffraction File. JCPDS-ICDD, Newton Square, PA, USA.
3. Kittel, C. (1966). Introduction to Solid State Physics. New York: Wiley.
4. Ortner, B. (1986a). Advances in X-ray Analysis, Vol. 29, pp. 113-118. New York: Plenum.
5. Ortner, B. (1986b). Advances in X-ray Analysis, Vol. 29, pp. 387-394. New York: Plenum.