Metrology at the nano scale

Physics World

Volumn 18, Issue 8, 2005, Pages 37-40

  Sheridan, Ben ^a   Cumpson, Peter ^a   Bailey, Marc ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DISTANCE MEASUREMENT; DNA SEQUENCES; ELECTRIC VARIABLES MEASUREMENT; MEASUREMENT THEORY; MECHANICAL VARIABLES MEASUREMENT; MICROELECTROMECHANICAL DEVICES; MICROELECTRONICS; OPTICAL MICROSCOPY;

BIOMOLECULES; NANO-SCALE MEASUREMENTS; NANOMETROLOGY; QUANTUM CURRENT;

NANOTECHNOLOGY;

EID: 23744506909     PISSN: 09538585     EISSN: None     Source Type: Trade Journal    
DOI: 10.1088/2058-7058/18/8/35     Document Type: Review

References (0)