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1
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33644568557
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IS&T, Springfield, VA
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Portions of this work have been previously reported: M. Oakland, D. E. Bugner, R. Van Hanehem, P. Artz, and D. Zaccour, Proc. IS&T's NIP 19, IS&T, Springfield, VA, 2003, pp. 397-410.
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(2003)
Proc. IS&T's NIP
, vol.19
, pp. 397-410
-
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Oakland, M.1
Bugner, D.E.2
Van Hanehem, R.3
Artz, P.4
Zaccour, D.5
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2
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1442306420
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-
IS&T, Springfield, VA
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E. Zinn, E. Nishimura and J. Reilly, Proc. IS&T's NIP 15, IS&T, Springfield, VA, 1999, pp. 416-420.
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(1999)
Proc. IS&T's NIP
, vol.15
, pp. 416-420
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Zinn, E.1
Nishimura, E.2
Reilly, J.3
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3
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1442330793
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-
IS&T, Springfield, VA
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S. Schuttel and R. Hofmann, Proc. IS&T's NIP 15, IS&T, Springfield, VA, 1999, pp. 120-123.
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(1999)
Proc. IS&T's NIP
, vol.15
, pp. 120-123
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Schuttel, S.1
Hofmann, R.2
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4
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1442354241
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-
IS&T, Springfield, VA
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D. E. Bugner and C. Suminski, Proc. IS&T's NIP 16, IS&T, Springfield, VA, 2000, pp. 90-94.
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(2000)
Proc. IS&T's NIP
, vol.16
, pp. 90-94
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Bugner, D.E.1
Suminski, C.2
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5
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1442329565
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-
IS&T, Springfield, VA
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S. Guo and N. Miller, Proc. IS&T's NIP 17, IS&T, Springfield, VA, 2001, pp. 186-191.
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(2001)
Proc. IS&T's NIP
, vol.17
, pp. 186-191
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Guo, S.1
Miller, N.2
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6
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1442329563
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-
IS&T, Springfield, VA
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H. Onishi, M. Hanmura, H. Kanada, and T. Kaieda, Proc. IS&T's NIP 17, IS&T, Springfield, VA, 2001, pp. 192-96.
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(2001)
Proc. IS&T's NIP
, vol.17
, pp. 192-196
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Onishi, H.1
Hanmura, M.2
Kanada, H.3
Kaieda, T.4
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7
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1442329557
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-
IS&T, Springfield, VA
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H. Wilhelm and M. McCormick-Goodhart, Proc. IS&T's NIP 17, IS&T, Springfield, VA, 2001, pp. 197-202.
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(2001)
Proc. IS&T's NIP
, vol.17
, pp. 197-202
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Wilhelm, H.1
McCormick-Goodhart, M.2
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8
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1442280593
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-
IS&T, Springfield, VA
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G. Van Ackere, H. Kanora, M. Graindourze, H. Friedel, and S. Lingier, Proc. IS&T's NIP 17, IS&T, Springfield, VA, 2001, pp. 213-17.
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(2001)
Proc. IS&T's NIP
, vol.17
, pp. 213-217
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Van Ackere, G.1
Kanora, H.2
Graindourze, M.3
Friedel, H.4
Lingier, S.5
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9
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1442305172
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-
IS&T, Springfield, VA
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B. Vogt and F. Frey, Proc. IS&T's NIP 17, IS&T, Springfield, VA, 2001, pp. 218-21.
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(2001)
Proc. IS&T's NIP
, vol.17
, pp. 218-221
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Vogt, B.1
Frey, F.2
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10
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1442280589
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-
IS&T, Springfield, VA
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R. Steiger, P.-A. Brugger, and M. Staiger, Proc. IS&T's NIP 17, IS&T, Springfield, VA, 2001, pp. 222-25.
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(2001)
Proc. IS&T's NIP
, vol.17
, pp. 222-225
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Steiger, R.1
Brugger, P.-A.2
Staiger, M.3
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11
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1442353103
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Thesis, Department of Image Engineering, University of Applied Science, Cologne, Germany
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B. Vogt, Stability Issues and Test Methods for Ink Jet Materials, Thesis, Department of Image Engineering, University of Applied Science, Cologne, Germany, 2001.
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(2001)
Stability Issues and Test Methods for Ink Jet Materials
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Vogt, B.1
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12
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1442300412
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-
IS&T, Springfield, VA
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D. E. Bugner, D. Kopperl, and P. Artz, Proc. IS&T 12th Int. Symp. on Photofinishing, IS&T, Springfield, VA, 2002, pp. 54-57.
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(2002)
Proc. IS&T 12th Int. Symp. on Photofinishing
, pp. 54-57
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Bugner, D.E.1
Kopperl, D.2
Artz, P.3
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13
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1442352667
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IS&T, Springfield, VA
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H. Onishi, H. Kanada, T. Sano, and K. Takemoto, Proc. IS&T's NIP 18, IS&T, Springfield, VA, 2002, pp. 315-318.
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(2002)
Proc. IS&T's NIP
, vol.18
, pp. 315-318
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Onishi, H.1
Kanada, H.2
Sano, T.3
Takemoto, K.4
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14
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1442279210
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IS&T, Springfield, VA
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E. Burch, A. Kabalnov, N. Miller, C. Dupuy, B.-J. Niu, P. Wang, S. Guo, P. Tyrell and L. Deardurff, Proc. IS&T's NIP 18, IS&T, Springfield, VA, 2002, pp. 342-347.
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(2002)
Proc. IS&T's NIP
, vol.18
, pp. 342-347
-
-
Burch, E.1
Kabalnov, A.2
Miller, N.3
Dupuy, C.4
Niu, B.-J.5
Wang, P.6
Guo, S.7
Tyrell, P.8
Deardurff, L.9
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15
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1442280763
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-
IS&T, Springfield, VA
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P. Hill, K. Suitor, and P. Artz, Proc. IS&T's NIP 16, IS&T, Springfield, VA, 2000, pp. 70-73.
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(2000)
Proc. IS&T's NIP
, vol.16
, pp. 70-73
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Hill, P.1
Suitor, K.2
Artz, P.3
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17
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1442305177
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-
IS&T, Springfield, VA
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M. Oakland, D. E. Bugner, R. Levesque, and P. Artz, Proc. IS&T's NIP 17, IS&T, Springfield, VA, 2001, pp. 167-70.
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(2001)
Proc. IS&T's NIP
, vol.17
, pp. 167-170
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Oakland, M.1
Bugner, D.E.2
Levesque, R.3
Artz, P.4
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18
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1442305175
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IS&T, Springfield, VA
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M. McCormick-Goodhart and H. Wilhelm, Proc. IS&T's NIP 17, IS&T, Springfield, VA, 2001, pp. 179-185.
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(2001)
Proc. IS&T's NIP
, vol.17
, pp. 179-185
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McCormick-Goodhart, M.1
Wilhelm, H.2
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19
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1442279222
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IS&T, Springfield, VA
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S. Guo, N. Miller, and D. Weeks, Proc. IS&T's NIP 18, IS&T, Springfield, VA, 2002, pp. 319-325.
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(2002)
Proc. IS&T's NIP
, vol.18
, pp. 319-325
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Guo, S.1
Miller, N.2
Weeks, D.3
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20
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1442354054
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IS&T, Springfield, VA
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M. Oakland, D. E. Bugner, R. Levesque, and R. Vanhanehem, Proc. IS&T's NIP 17, IS&T, Springfield, VA, 2001, pp. 175-178.
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(2001)
Proc. IS&T's NIP
, vol.17
, pp. 175-178
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Oakland, M.1
Bugner, D.E.2
Levesque, R.3
Vanhanehem, R.4
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21
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1642409211
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IS&T, Springfield, VA
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D. Sid, Proc. IS&T's NIP 17, IS&T, Springfield, VA, 2001, pp. 171-174.
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(2001)
Proc. IS&T's NIP
, vol.17
, pp. 171-174
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Sid, D.1
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22
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1442349395
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SPSTJ, Tokyo, Japan
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K. Kitamura, H. Hayashi, and Y. Oki, Proc. ICIS '02, SPSTJ, Tokyo, Japan, 2002, pp. 539-542.
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(2002)
Proc. ICIS '02
, pp. 539-542
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Kitamura, K.1
Hayashi, H.2
Oki, Y.3
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23
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1642362215
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IS&T, Springfield, VA
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P. Wight, Proc. IS&T's NIP 18, IS&T, Springfield, VA, 2002, pp. 334-336.
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(2002)
Proc. IS&T's NIP
, vol.18
, pp. 334-336
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Wight, P.1
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24
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1642369034
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IS&T, Springfield, VA
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M. Thornberry and S. Looman, Proc. IS&T's NIP 19, IS&T, Springfield, VA, 2003, pp. 426-430.
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(2003)
Proc. IS&T's NIP
, vol.19
, pp. 426-430
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Thornberry, M.1
Looman, S.2
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26
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79952473745
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M. Howe-Grant, Ed., John Wiley and Sons, New York
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Encyclopedia of Chemical Technology, 4th ed., M. Howe-Grant, Ed., John Wiley and Sons, New York, 1996, vol. 17, pp. 953-994.
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(1996)
Encyclopedia of Chemical Technology, 4th Ed.
, vol.17
, pp. 953-994
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27
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33644580061
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May
-
For a brief review of ozone formation see: P. Borrell, Chem. Brit. 38-41 (May, 2003).
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(2003)
Chem. Brit.
, pp. 38-41
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-
Borrell, P.1
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31
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0021377229
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T. D. Davies, B. Ramer, G. Kaspyzok, and A. C. Delany, J. Air Pollution Control Assoc. 31(2), 135-137 (1984).
-
(1984)
J. Air Pollution Control Assoc.
, vol.31
, Issue.2
, pp. 135-137
-
-
Davies, T.D.1
Ramer, B.2
Kaspyzok, G.3
Delany, A.C.4
-
32
-
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33644561350
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-
note
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Posted at http://www.appliedozone.net/ozhome.html, March 16, 2002: "The best solution to...(indoor) pollution is to create indoors what nature provides outdoors. Ozone generators will clean the air in any environment and produce the same amount...that occurs naturally outdoors. In controls bacteria, fungus, mildew, spores, and viruses. It will breakdown toxic or noxious chemical gases, formaldehyde, radon, cleaning agents, paint fumes, and bad odors."
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35
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33644568788
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U.S. Patents 2,641,602 and 2,651,641
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J. M. Straley and J. B. Dickey, U.S. Patents 2,641,602 and 2,651,641 (1953).
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(1953)
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Straley, J.M.1
Dickey, J.B.2
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43
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1442279678
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SPSTJ, Tokyo, Japan
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(a) D. E. Bugner and P. Artz, Proc. ICIS '02, SPSTJ, Tokyo, Japan, 2002, pp. 308-310;
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(2002)
Proc. ICIS '02
, pp. 308-310
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Bugner, D.E.1
Artz, P.2
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45
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1442303795
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IS&T, Springfield, VA
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Y. Shibahara, H. Ishizuka, N. Muro, Y. Kanazawa, and Y. Seoka, Proc. IS&T's NIP 18, IS&T, Springfield, VA, 2002, pp. 330-333.
-
(2002)
Proc. IS&T's NIP
, vol.18
, pp. 330-333
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Shibahara, Y.1
Ishizuka, H.2
Muro, N.3
Kanazawa, Y.4
Seoka, Y.5
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46
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33644579964
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(a) ANSI IT9.9 (1996)
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(a) ANSI IT9.9 (1996);
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-
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47
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33644575475
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ASTM F2035 (2000); and
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(b) ASTM F2035 (2000); and
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-
-
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48
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33644573309
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ASTM F2037 (2000)
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(c) ASTM F2037 (2000).
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-
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50
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33644576626
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note
-
This particular combination of ink and paper was chosen based on preliminary observations that suggested that we could expect to see approximately 30% fade from a nominal 1.0 initial density under these conditions.
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