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Volumn 53, Issue 2, 2005, Pages 157-161

Defect states in the CIGS solar cells by photocapacitance and deep level optical spectroscopy

Author keywords

CIGS; Deep levels; Photocapacitance; Solar cells

Indexed keywords


EID: 23744491871     PISSN: 02397528     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (16)

References (18)
  • 2
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    • CIS-based thin-film photovoltaic modules: Potential and prospects
    • B. Dimmler, M. Powalla, and H.W. Schock, "CIS-based thin-film photovoltaic modules: potential and prospects", Prog. Photov.: Res. Appl. 10, 149-57 (2002).
    • (2002) Prog. Photov.: Res. Appl. , vol.10 , pp. 149-157
    • Dimmler, B.1    Powalla, M.2    Schock, H.W.3
  • 3
    • 0032593271 scopus 로고    scopus 로고
    • Electronic properties of Cu(In,Ga)Se2 heterojunction solar cells-recent achievements, current understanding, and future challenges
    • U. Rau and H.W. Schock, "Electronic properties of Cu(In,Ga)Se2 heterojunction solar cells-recent achievements, current understanding, and future challenges", Appl. Phys. A69, 131-47 (1999).
    • (1999) Appl. Phys. , vol.A69 , pp. 131-147
    • Rau, U.1    Schock, H.W.2
  • 9
    • 1642454855 scopus 로고    scopus 로고
    • 2 absorbers of thin film solar cells studied by junction capacitance techniques
    • 2 absorbers of thin film solar cells studied by junction capacitance techniques", Opto-Electron. Rev. 11, 261-267 (2003).
    • (2003) Opto-Electron. Rev. , vol.11 , pp. 261-267
    • Igalson, M.1    Zabierowski, P.2
  • 10
    • 0036467917 scopus 로고    scopus 로고
    • Wide gap chalcopyrites: Material properties and solar cells
    • S. Siebentritt, "Wide gap chalcopyrites: material properties and solar cells", Thin Solid Films 403-404, 1-8 (2002).
    • (2002) Thin Solid Films , vol.403-404 , pp. 1-8
    • Siebentritt, S.1
  • 13
    • 0033906820 scopus 로고    scopus 로고
    • Transient capacitance spectroscopy of defect levels in CIGS devices
    • M. Igalson and P. Zabierowski, "Transient capacitance spectroscopy of defect levels in CIGS devices", Thin Solid Films 361-362, 371-7 (2000).
    • (2000) Thin Solid Films , vol.361-362 , pp. 371-377
    • Igalson, M.1    Zabierowski, P.2
  • 18
    • 0001076239 scopus 로고    scopus 로고
    • 2 on its electronic, structural, and defect properties
    • 2 on its electronic, structural, and defect properties", Appl Phys. Lett. 72, 3199-3201 (1998).
    • (1998) Appl Phys. Lett. , vol.72 , pp. 3199-3201
    • Wei, S.H.1    Zhang, S.B.2    Zunger, A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.