Quick assessment of homogeneity in large-diameter InP substrate by mapping near-infrared transmittance

Conference Proceedings - International Conference on Indium Phosphide and Related Materials

Volumn , Issue , 2004, Pages 599-602

  Shiomi, Ryo ^a   Kawase, Tomohiro ^a,b   Yamada, Masayoshi ^a  

^a KYOTO INSTITUTE OF TECHNOLOGY   (Japan)

^b SUMITOMO ELECTRIC INDUSTRIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; COMPUTER SOFTWARE; IMAGING TECHNIQUES; LIGHT EMITTING DIODES; REFRACTIVE INDEX; SEMICONDUCTOR DOPING; SIGNAL TO NOISE RATIO; TIN;

LIGHT INTENSITIES; MICROSCOPIC HOMOGENEITIES; NEAR-INFRARED (NIR) TRANSMITTANCE; VIDEO SIGNALS;

SEMICONDUCTING INDIUM PHOSPHIDE;

EID: 23744436621     PISSN: 10928669     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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