Martensitic transformation of Ni2.18Mn0.82Ga single crystal observed by synchrotron radiation white X-ray diffraction

Materials Transactions

Volumn 46, Issue 6, 2005, Pages 1425-1432

  Inoue, Kazuko ^a   Yamaguchi, Yasuo ^b,c   Ohsumi, Kazumasa ^d   Kusaka, Katsuhiro ^d   Nakagawa, Takeshi ^d  

^a RYUKOKU UNIVERSITY   (Japan)

^b JAPAN ATOMIC ENERGY AGENCY   (Japan)

^c TOHOKU GAKUIN UNIVERSITY   (Japan)

^d INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

Author keywords

Martensitic transformation; Shape memory effect; Single crystal of Ni2.18Mn0.82Ga; Synchrotron radiation white X ray diffraction

Indexed keywords

CRYSTAL GROWTH; CRYSTAL STRUCTURE; FERROMAGNETISM; MARTENSITIC TRANSFORMATIONS; NEUTRON DIFFRACTION; NICKEL COMPOUNDS; SHAPE MEMORY EFFECT; SYNCHROTRON RADIATION; X RAY DIFFRACTION;

HEUSLER STRUCTURE; SINGLE CRYSTAL OF NI2.18MN0.82GA; SYNCHROTRON RADIATION WHITE X-RAY DIFFRACTION; TEMPERATURE DEPENDENCE;

SINGLE CRYSTALS;

EID: 23644447559     PISSN: 13459678     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans.46.1425     Document Type: Article

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