Radiation-induced charge trapping and recombination process in natural topaz studied by TL, EPR and XRD

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 218, Issue 1-4, 2004, Pages 123-127

  Souza, Divanizia N ^a   De Lima, José Fernandes ^a   Valerio, Mário Ernesto G ^a   Sasaki, José Marcos ^b   Caldas, Linda V E ^c  

^a FEDERAL UNIVERSITY OF SERGIPE   (Brazil)

^b FEDERAL UNIVERSITY OF CEARÁ   (Brazil)

^c INSTITUTO DE PESQUISAS ENERGÉTICAS E NUCLEARES   (Brazil)

Author keywords

EPR; Powder X ray diffraction; TL; Topaz

Indexed keywords

CRYSTALS; GAMMA RAYS; LIGHT EMISSION; NEGATIVE IONS; PARAMAGNETIC RESONANCE; SAMPLING; THERMOLUMINESCENCE; X RAY DIFFRACTION;

CHARGE TRAPPING; POWDER X-RAY DIFFRACTION; THERMOLUMINESCENCE (TL); TRAPPING CENTERS;

TOPAZ;

EID: 2342652927     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2003.12.050     Document Type: Conference Paper

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