Accelerated stress testing for both hardware and software

Proceedings of the Annual Reliability and Maintainability Symposium

Volumn , Issue , 2004, Pages 346-351

  Chan, H Anthony ^a  

^a UNIVERSITY OF CAPE TOWN   (South Africa)

Author keywords

Reliability; Stress testing

Indexed keywords

ACCELERATED STRESS TESTING (AST); PRODUCT WEAKNESS DETECTION; TIME-TO-MARKET; ACCELERATED STRESS TESTING; FUNDAMENTAL PRINCIPLES; HARDWARE AND SOFTWARE; RELIABILITY CONCEPTS; RELIABILITY PRINCIPLES; RESEARCH AND DEVELOPMENT; SOFTWARE AND HARDWARES; STRESS TESTING;

COMPUTER HARDWARE; CONCURRENT ENGINEERING; FAILURE ANALYSIS; RELIABILITY THEORY; STRESS ANALYSIS; TESTING; THERMAL CYCLING; VIBRATIONS (MECHANICAL); COMPUTER SOFTWARE; DEFECTS; HARDWARE; MAINTAINABILITY; QUALITY CONTROL; RELIABILITY; SOFTWARE TESTING; STRESSES; VIBRATION ANALYSIS;

COMPUTER SOFTWARE; SOFTWARE RELIABILITY;

EID: 2342650761     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. H.A. Chan, "A Formulation of Environmental Stress Testing & Screening," Proceedings of the 1994 Annual Reliability & Maintainability Symposium, Anaheim, Jan. 1994, pp. 99-104.
2. H.A. Chan and P. Englert, eds. Accelerated Stress Testing Handbook: Guide for Achieving Quality Products. IEEE Press, 2001, ISBN 0-7803-6025-7.
3. M. Werner and J. Bozarth, "Improving Customer Satisfaction via Accelerated Stress Testing of General Purpose Computer Operating Systems," submitted to IEEE Transactions on Computers.
4. M. Werner, J. Bozarth, and H.A. Chan, "Dependability of Operating Systems using Accelerated Stress Testing," presented at IEEE Workshop on Accelerated Stress Testing, Montreal, October 2-4, 2002.