Classification of fungal-damaged soybean seeds using near-infrared spectroscopy

International Journal of Food Properties

Volumn 7, Issue 1, 2004, Pages 75-82

  Wang, D ^a,b   Dowell, F E ^c   Ram, M S ^c   Schapaugh, W T ^b  

^a Sunflower Networking Group   (United States)

^b KANSAS STATE UNIVERSITY   (United States)

^c AGRICULTURAL RESEARCH SERVICE   (United States)

Author keywords

Fungal damage; Near infrared spectroscopy; Soybean seeds

Indexed keywords

BACTERIA; CALIBRATION; DISCOLORATION; FUNGI; IMAGE PROCESSING; INFRARED SPECTROSCOPY; NEURAL NETWORKS; PHYSICAL PROPERTIES; REFLECTION; SEED;

FUNGAL PATHOGENS; FUNGAL-DAMAGE; NEAR-INFRARED SPECTROSCOPY; SOYBEAN SEEDS;

CROPS;

BACTERIA (MICROORGANISMS); CERCOSPORA; CERCOSPORA KIKUCHII; FUNGI; GLYCINE MAX; PERONOSPORA FARINOSA; PHOMOPSIS; SOYBEAN MOSAIC VIRUS;

EID: 2342650691     PISSN: 10942912     EISSN: None     Source Type: Journal    
DOI: 10.1081/JFP-120022981     Document Type: Article

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