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Volumn 5173, Issue , 2003, Pages 69-77

Comparison of the Measured and Analytical Response Profiles of a 3.3 to 15.5 μ Imaging System and the Effect of Detector Diffusion

Author keywords

Detector; Hgcdte; Lateral diffusion length; Spatial response

Indexed keywords

LATERAL DIFFUSION LENGTH; PIXELS; SPATIAL RESPONSE; TIME FRAMES;

EID: 2342647544     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.511514     Document Type: Conference Paper
Times cited : (3)

References (10)
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    • Jet Propulsion Laboratory, National Aeronautics and Space Administration, Contract 961089, (2001).
  • 8
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    • Ch. 10, Academic press, Inc., San Diego
    • D.J. Schroeder, Astronomical Optics, Ch. 10, Academic press, Inc., San Diego, 1987.
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    • Schroeder, D.J.1
  • 10
    • 0036462737 scopus 로고    scopus 로고
    • Resistance area product of diodes in a long-wavelength infrared HgCdTe mosaic array
    • V. Gopal, Resistance area product of diodes in a long-wavelength infrared HgCdTe mosaic array, Infrared Physics and Technology, Vol. 43, (2000).
    • (2000) Infrared Physics and Technology , vol.43
    • Gopal, V.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.