Identification of multiple cracks from eddy-current testing signals with noise sources by image processing and inverse analysis

IEEE Transactions on Magnetics

Volumn 40, Issue 2 II, 2004, Pages 1112-1115

  Nagaya, Yoshiaki ^a   Takagi, Toshiyuki ^a   Uchimoto, Tetsuya ^a   Huang, Haoyu ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

Eddy current testing; Inverse problem; Multiple cracks; Support plates; Template matching

Indexed keywords

COMPUTER SIMULATION; CRACKS; GENETIC ALGORITHMS; IMAGE PROCESSING; INVERSE PROBLEMS; SCANNING; SPURIOUS SIGNAL NOISE; STEAM GENERATORS;

CRACK SHAPES; MULTIPLE CRACKS; SUPPORT PLATES; TEMPLATE MATCHING;

EDDY CURRENT TESTING;

EID: 2342640327     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2004.825322     Document Type: Article

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