Physics-based polarimetric BRDF models

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5192, Issue , 2003, Pages 129-140

  Duncan, Donald D ^a   Hahn, Daniel V ^a   Thomas, Michael E ^a  

^a JOHNS HOPKINS UNIVERSITY APPLIED PHYSICS LABORATORY   (United States)

Author keywords

Bi directional reflectance distribution function; BRDF; Emittance; Polarization; Reflectance

Indexed keywords

PHOTON EMISSION; SCATTER ANGLES; SPATIAL COHERENCE;

DATA REDUCTION; LIGHT SCATTERING; OPTICAL CORRELATION; OPTICS; PHOTONS; POLARIZATION; REFLECTION; REFRACTIVE INDEX; SURFACE ROUGHNESS;

POLARIMETERS;

EID: 2342639619     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.507317     Document Type: Conference Paper

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