An Economical Method for X-Ray Inspection of Wheat

2000 ASAE Annual Intenational Meeting, Technical Papers: Engineering Solutions for a New Century

Volumn 1, Issue , 2000, Pages 895-906

  Haff, Ron ^a   Toyofuku, Natsuko ^a  

^a AGRICULTURAL RESEARCH SERVICE   (United States)

Author keywords

Granary weevils x ray wheat

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; CONTAMINATION; IMAGE PROCESSING; INSECT CONTROL; INSPECTION; X RAY ANALYSIS;

GRANARY WEEVILS; HIGH RESOLUTION IMAGES; WHEAT; X RAY IMAGES;

CROPS;

EID: 2342633795     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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