Determination of the chemical properties of residues retained in individual cloud droplets by XRF microprobe at SPring-8

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 217, Issue 4, 2004, Pages 657-665

  Ma, C J ^a   Tohno, S ^a   Kasahara, M ^a   Hayakawa, S ^b  

^a KYOTO UNIVERSITY   (Japan)

^b HIROSHIMA UNIVERSITY   (Japan)

Author keywords

Individual cloud droplets; Individual particles; Replication; Residue; SPring 8; XRF microprobe

Indexed keywords

ATMOSPHERIC AEROSOLS; COMPOSITION; CONDENSATION; EVAPORATION; METEOROLOGY; PRECIPITATION (METEOROLOGY); SUPERSATURATION; TROPOSPHERE; X RAY ANALYSIS;

INDIVIDUAL CLOUD DROPLETS; INDIVIDUAL PARTICLES; REPLICATION; RESIDUE; SPRING-8; XRF MICROPROBE;

CLOUDS;

EID: 2342632000     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2003.12.042     Document Type: Article

References (16)

1. Vong R.J., Baker B.M., Brechtel F.J., Collier R.T., Harris J.M., Kowalski A.S., Mcdonald N.C., Mcinnes N.M. Atmos. Environ. 31:1997;1991.
2. Ma C.-J., Kasahara M., Tohno S. Atmos. Environ. 37:2003;3749.
3. Song C.H., Carmichael G.R. Atmos. Environ. 33:1999;2203.
4. Ma C.-J., Kasahara M., Hwang K.C., Choi K.C. J. Korea Soc. Atmos. Environ. 16E:2000;29.
5. Desboeufs K.V., Losno R., Colin J.L. Atmos. Environ. 35:2001;3529.
6. C.-J. Ma, S. Tohno, M. Kasahara, S. Hayakawa, Atmos. Environ., in press.
7. Ma C.-J., Kasahara M., Tohno S. Water, Air, Soil Pollut. 130:2001;1601.
8. Ma C.-J., Kasahara M., Tohno S., Sakai T. Atmos. Environ. 37:2003;4679.
9. Hayakawa S., Ikuta N., Suzuki M., Wakatsuki M., Hirokawa T. J. Synchr. Radiat. 8:2001;328.
10. Ma C.-J., Kasahara M., Tohno S., Hwang K.C. Atmos. Environ. 35:2001;747.
11. Kasahara M., Takahashi K., Sakisaka M., Tomita M. Nucl. Instr. and Meth. B. 75:1993;136.
12. Gieray R., Wieser P., Engelhardt T., Swietlicki E., Hansson H.-C., Mentes B., Orsini D., Martinsson B., Svenningsson B., Noone K.J., Heintsenberg J. Atmos. Environ. 31:1997;2491.
13. Pruppacher H.R., Klett J.D. 1990;D. Reidel Publishing Company. p. 484.
14. Desboeusf K.V., Losno R., Colin J.L. Atmos. Environ. 35:2001;3529.
15. Nakai I., Numako C., Hayakawa S., Tsuchiyama A. J. Trace Microp. Tech. 16:1998;87.
16. Wang X., Guanghua Z. Int. J. PIXE. 6:1996;361.