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Volumn 108, Issue 1-4, 2004, Pages 347-350
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Spectroscopy of single silicon nanoparticles
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Author keywords
Extended red emission; Nanoparticles; Photophysics; Silicon; Spectroscopy
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Indexed keywords
BLEACHING;
ELECTROCHEMISTRY;
ETCHING;
IRRADIATION;
LASER BEAM EFFECTS;
NANOSTRUCTURED MATERIALS;
PARTICLE SIZE ANALYSIS;
QUANTUM THEORY;
EXTENDED RED EMISSION (ERE);
NANOPARTICLES;
PHOTOBLEACHING;
PHOTOPHYSICS;
SILICON;
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EID: 2342625344
PISSN: 00222313
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jlumin.2004.01.073 Document Type: Conference Paper |
Times cited : (22)
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References (23)
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