Crystal structure of salicyldehyde p-toluenesulfonylhydrazone, C14H14N2O3S

Zeitschrift fur Kristallographie - New Crystal Structures

Volumn 212, Issue 1, 1997, Pages 277-278

  Ng, Seik Weng ^a  

^a UNIVERSITY OF MALAYA   (Malaysia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 2342613726     PISSN: 14337266     EISSN: None     Source Type: Journal    
DOI: 10.1524/ncrs.1997.212.1.277     Document Type: Article

References (6)

1. Enraf-Noaius Delft; CAD4 VAX/PC Fortran System. Operator's Guide to the Enraf-Nonius CAD4 Diffractoroeter Haidware, its Software and the Operating System. Enraf-Nonius Delft, Scientific Instruments Division, PO Box 483,2600 AL Delft, The Netherlands 1988.
2. Hall, S. R.; Stewart, J. M. (Editors): Xtal Version 3.0. Reference Manual. Universities of Western Australia, Australia, and Maryland, USA 1990.
3. North, A. C. T.; Phillips, D. C.; Mathews, F. S.: A Semi-Empirical Method of Absorption Correction. Acta Crystallogr. A24 (1968) 351-359.
4. Sheldrick, G. M.: Phase Annealing in SHELX-90: Direct Methods for Larger Structures. Acta Crystallogr. A46 (1990) 467-473.
5. Sheldrick, G. M.: SHELXTL/PC. Structure Determination Software Programs. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA 1990.
6. Sheldrick, G. M.: SHELXL-93. Program for Crystal Structure Refinement. University of Göttingen, Göttingen, Germany 1993.