Topographic profiling and refractive-index analysis by use of differential interference contrast with bright-field intensity and atomic force imaging

Applied Optics

Volumn 43, Issue 11, 2004, Pages 2272-2284

  Axelrod, Noel ^a   Radko, Anna ^a   Lewis, Aaron ^a   Ben Yosef, Nissim ^a  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ATOMIC FORCE MICROSCOPY; CONVOLUTION; IMAGE RECONSTRUCTION; LINEAR EQUATIONS; MICROSCOPIC EXAMINATION; OPTICAL WAVEGUIDES; REFRACTIVE INDEX; SIGNAL INTERFERENCE;

ATOMIC FORCE IMAGING; BRIGHT FIELD INTENSITY; DIFFERENTIAL INTERFERENCE CONTRAST; TOPOGRAPHIC PROFILING;

IMAGING TECHNIQUES;

EID: 2342590095     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.43.002272     Document Type: Article

References (17)

1. C. Preza, "Rotational-diversity phase estimation from differential-interference-contrast microscopy images," J. Opt. Soc. Am. A 17, 415-424 (2000).
2. J. M. Kahn and K. P. Ho, "Communications technology: A bottleneck for optical fibres," Nature 411, 1007-1010 (2001).
3. S. Inoue and K. R. Spring, Video Microscopy: the Fundamentals (Plenum, New York, 1986), pp. 410-412.
4. T. J. Holmes, "Signal-processing characteristics of differential-interference-contrast microscopy. 2: Noise considerations in signal recovery," Appl. Opt. 27, 1302-1309 (1988).
5. E. B. van Munster, L. J. van Vliet, and J. A. Aten, "Reconstruction of optical pathlength distributions from images obtained by a wide-field differential interference contrast microscope," J. Microsc. (Oxford) 188, 149-157 (1997).
6. C. J. Cogswell, N. I. Smith, K. G. Larkin, and P. Hariharan, "Quantitative DIC microscopy using a geometric phase shifter," in Three-Dimensional Microscopy: Image Acquisition Processing IV, C. J. Cogswell, J.-A. Conchello, and T. Wilson, eds., Proc. SPIE 2984, 72-81 (1997).
7. C. Preza, D. L. Snyder, and J. A. Conchello, "Theoretical development and experimental evaluation of imaging models for differential-interference-contrast microscopy," J. Opt. Soc. Am. A 16, 2185-2199 (1999).
8. R. L. Lagendijk and J. Biemond, Iterative Identification and Restoration of Images (Kluwer Academic, Dordrecht, The Netherlands, 1991), pp. 65-69.
9. J. W. Woods and V. K. Ingle, "Kalman filtering in two dimensions: further results," IEEE Trans. Acoust. Speech Signal Process. 29, 188-197 (1981).
10. C. J. Cogswell and C. J. R. Sheppard, "Confocal differential interference contrast (DIC) microscopy: including a theoretical analysis of conventional and confocal DIC imaging," J. Microsc. (Oxford) 165, 81-101 (1992).
11. P. J. Verveer, M. J. Gemkow, and T. M. Jovin, "A comparison of image restoration approaches applied to three-dimensional confocal and wide-field fluorescence microscopy," J. Microsc. (Oxford) 193, 50-61 (1999).
12. M. Born and E. Wolf, Principles of Optics (Pergamon, London, 1959), pp. 434-441.
13. A. Lewis, K. Lieberman, N. Ben-Ami, G. Fish, E. Khachatryan, U. Ben-Ami, and S. Shalom, "New design and imaging concepts in NSOM," Ultramicroscopy 61, 215-220 (1995).
14. N. Axelrod, A. Radko, N. Ben-Yosef, A. Khatchatouriants, M. Treinin, and A. Lewis, "Near-field optical and atomic force constraints for superresolution 3D deconvolution in far-field optical microscopy," in Three-Dimensional and Multidimensional Microscopy: Image Acquisition Processing VII, J. A. Conchello, C. J. Cogswell, A. G. Tescher, and T. Wilson, eds., Proc. SPIE 3919, 161-171 (2000).
15. N. Streibl, "Three-dimensional imaging by a microscope," J. Opt. Soc. Am. A 2, 121-127 (1985).
16. G. A. Korn and T. M. Korn, Mathematical Handbook for Scientists and Engineers (McGraw-Hill, Mew York, 1961), p. 539.
17. R. L. Lagendijk and J. Biemond, Iterative Identification and Restoration of Images (Kluwer Academic, Dordrecht, The Netherlands, 1991), pp. 71-79.